Loading Events

3M4Q COMPETITION

May 21 @ 8:00 am - 10:00 am UTC

3M4Q COMPETITION May 21st, 2022 National Engineering School of Sfax The competition 3M4Q (3 minutes to answer 4 questions) will be organized on Saturday, May 21st, 2022, during the days of the Doctoral School Science & Technology (JEDST). During the competition 3M4Q, participants are to deliver a short talk in a presentation to convince a diverse audience of the interest of their PhD research. In the 3 minutes talk, they should answer these 4 questions: The choice of their PhD subject; the way it was tackled; the impact of their research work; and the sustainability of the research results. To be able to participate in this edition of the competition 3M4Q, you should: – prepare a 3mn video recording as explained above, and – belong to a Tunisian University, and – be either a PhD student in the final phase of the thesis, or a new doctor (thesis defended after Oct. 1st, 2021) Submissions, in French or English, should be done online using this form: 3M4Q JEDST 2022. These will be peer-reviewed based on: A. how the 4 questions are approached (10 points); B. clarity of the presentation (10 points). Based on the review results, the best submissions will be short-listed. Respective students (15 to 20) will be notified by email and should attend the competition in person. On the day of the competition, the evaluation will be based on feedback from the scientific committee, professors, and guests from the industry. Submission deadline: Tuesday, April 26, 2022 Notification: Tuesday, May 10, 2022 CERTIFICATES & AWARDS – The students who will submit to this competition will receive Doctoral credits and a participation certificate. – The 15 to 20 short-listed participants will receive extra Doctoral credits and a participation certificate. – The first 5 winners will receive more extra Doctoral credits, certificates, and cash prizes (TND) as follows: 1st: 800 2nd: 700 3rd: 600 4th: 500 5th: 400 Extended results summary of this edition of the competition 3M4Q will be published in the IEEE Solid-State Circuits Magazine as in: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8811817 Virtual: https://events.vtools.ieee.org/m/309592